OmniScan™ X3 64 Phased Array and TFM Flaw Detector with Advanced Capabilities
Advantages you can use
Set on the tested and portable OmniScan X3 enclosure, OmniScan X3 64 flaw detector’s advance focusing capabilities supported by its huge element-aperture capacity, which authorizes you to fully operate 64-element phased array probes and 128-element aperture TFM/FMC. You can use its upgraded characteristics in inspections to solve issues of thick and thin materials and widen own potential to increase new procedures for spread range of applications.
OmniScan™ X3 Phased Array Flaw Detector with Innovative TFM
Confidence you can see
The OmniScan X3 flaw detector is a full set of phased array toolbox. High-powered tools, including total focusing method (TFM), ability of modern visualization capabilities, set by high image quality authorize you to complete your inspection with full confidence.
Confirm Your TFM Beam Coverage in Advance
The Acoustic Influence Map (AIM) tool gives immediate image of sensitivity based on TFM rule, probe, settings and assumed reflector.
The AIM tool takes out conjectures in creating scanning plans by visualizing the effect of set of wave (TFM mode) and gives opportunity to see where ends sensitivity and correct scanning plans accordingly.
Check, not to miss with PCI
New amplitude-free live phase coherence imaging (PCI) increases sensitivity to small defects and penetrates in noisy materials while easing your setup and simplifying sizing. Those characteristics are available on OmniScan X3 64 flaw detector as of MXU 5.10.
From any point of the world
The X3 RCS remote collaboration service allows the user to connect to colleague from any point of the world to the OmniScan X3 flaw detector, to get prompt consultation or transfer of control of the device, organize a working video meeting via online platform.
Gain advantage from a 64-Pulser Phased Array
Use the full advantage of 64-element phased array probes of OmniScan X3 64 flaw detector to reach upgraded resolution in focused point.
Move right: obtained using a 32-channel OmniScan X3 with 64-element probe (5L64-A32 model), S-scan presents image in high-quality, however resolution shows the fact of usage of middle 32 elements are enough for focused point.
Move left: using full 64-element probe (5L64-A32 probe), the OmniScan X3 64 flaw detector gives better PA resolution at focused point, by letting easily differ indications which are closer or in one point.
Access Full 128-Element Aperture TFM
Due to upgraded generation of electronics, TFM visualization offers better possibility of focus on small indications and improved signal-to-noise ratio (SNR). Because of 128-element probe the model OmniScan X3 64 provides increase in clarity of image.
Move right: TFM image acquires with 64 elements of a 128-element probe (3.5L128-I4 model) using an OmniScan X3 32-channel model.
Move left: the OmniScan X3 64 flaw detector authorizes to use the full 128-element probe of 3.5 MHz, 128-element I4 probe. Pay attention to the improved resolution and reduced background noise.
TFM data collection is up to 4 times faster
TFM data collection speed is 4 times faster when using a 64-element PFR. Compare with models OmniScan X3 32 and OmniScan X3 64, significantly improves efficiency in inspection due to its wider aperture.
Upgraded Phased Array
- Up to 3 times faster than the OmniScan MX2 (maximum pulse repetition rate)
- Single TOFD menu for an accelerated calibration workflow
- 800% high amplitude range reduces the need to rescan
- Onboard Dual Linear Array™ and Dual Matrix Array™ probe support accelerates setup creation
- Upgraded phased array
- OmniScan MX2 flaw detector 3 times faster (max pulse repetition frequency)
- Single TOFD menu for an accelerated calibration workflow
- 800% high amplitude range reduces the need to rescan
- Onboard Dual Linear Array™ and Dual Matrix Array™ probe support accelerates setup creation
Simplify Corrosion Monitoring
Using phased array to inspect corrosion offers huge benefits, including excellent coverage, resolution and data storage. Mastering the phased array method may seem challenging. The OmniScan X3 flaw detector combines upgraded functions such as gate synchronizing with reasonably designed software and eased menus that gives opportunity to receive correct data. It is quick to set configuration by using A-scan synchronization processing and manual time-corrected gain (TCG).
- Q1000088
- Q1000141
- Q1000089
- Q7640011
- U8100079
- U8100026
- U8760010
- U8780305
- U8100149
- U8100127
- U8100125
- U8100126
- Q1000228
- U8760010
- U8100079
- U8764053
- U8760010
- U8780305
- U8100132
- U8100149
- U8100127
- U8100125
- U8100126
- OMNIX3-PATFM32128PR-KIT
- OMNIX3-PATFM1664PR-KIT
- OMNIX3-PATFM16128PR-KIT
- OMNIX3-A-HCASE
- OMNI-MX2 MAINFRAME BASE KIT
- OMNI-A-BATT OMNISCAN BATTERY PACK
- OMNI-A2-SCREENPROTEC
- OMNI2-P2-UT-2C
- OMNI2-P2-PA32:128PR BASE KIT
- OMNI2-P2-PA32:128 BASE KIT
- OMNI2-P2-PA16:64 BASE KIT
- OMNI2-P2-PA16:128 BASE KIT
- OMNIX3-64-PATFM64128PR-WS-IBT
- OMNI-A-BATT OMNISCAN BATTERY PACK
- OMNI-MX2 MAINFRAME BASE KIT
- OMNI-A-SHCASE SMALL BLACK HARD CASE
- OMNI-A-BATT OMNISCAN BATTERY PACK
- OMNI-A2-SCREENPROTEC
- OMNI2-P2-UT-2C
- OMNI2-P2-PA32:128PR BASE KIT
- OMNI2-P2-PA32:128 BASE KIT
- OMNI2-P2-PA16:64 BASE KIT
- OMNI2-P2-PA16:128 BASE KIT
Materials from the resource www.evidentscientific.com were used in the preparation of the website.
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